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Rudolph Technologies, Inc. (NASDAQ-RTEC), a leading provider of process characterization equipment and software used by semiconductor manufacturers, announced today it has sold its lead scanner assets and licensed related intellectual property acquired from RVSI Inspection, LLC in January 2008, to privately-held BK…
http://www.sichinamag.comhttp://article.sichinamag.com/2008-07/2008715104354.htm -- 2008-7-15 0:00:00
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Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in process characterization solutions for the semiconductor manufacturing industry, today announced the sale of an NSX® Inspection System and Discover™ in-line defect analysis and data management software to Micronas, a leading supplier of int…
http://www.sichinamag.comhttp://article.sichinamag.com/2008-07/200871024436.htm -- 2008-7-1 0:00:00
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FLANDERS, NJ (May 28, 2008)—Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in high-performance process characterization systems for the semiconductor manufacturing industry, announced today that a major disk drive manufacturer has ordered a suite of inspection and metrology systems. The purc…
http://www.sichinamag.comhttp://article.sichinamag.com/2008-05/2008529104600.htm -- 2008-5-29 0:00:00
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Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in process characterization solutions for the semiconductor manufacturing industry, announced today that seven NSX® Series inspection tools were recently installed at WIN Semiconductors, the world’s leading foundry that serves the global wireless infor…
http://www.sichinamag.comhttp://article.sichinamag.com/2008-04/2008416013251.htm -- 2008-4-16 0:00:00
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Rudolph Technologies, Inc. , a leading provider of process characterization equipment and software for thin film measurement and macro defect inspection, and SEMATECH, the global consortium of leading chipmakers, announced today that Rudolph has become the first semiconductor equipment supplier company to join SEM…
http://www.sichinamag.comhttp://article.sichinamag.com/2008-02/2008221104141.htm -- 2008-2-21 0:00:00
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FLANDERS, NJ (January 22, 2008)—Rudolph Technologies, Inc. (NASDAQ-RTEC), a leading provider of process characterization equipment and software used in wafer processing and semiconductor final manufacturing (back-end) facilities, announced today that it has acquired all intellectual property and selected assets f…
http://www.sichinamag.comhttp://article.sichinamag.com/2008-01/2008123014944.htm -- 2008-1-23 0:00:00
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FLANDERS, NJ (November 14, 2007)—Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in high-performance process characterization systems for the semiconductor manufacturing industry, today announced that it has shipped 100 of its edge and backside automated macro defect inspection tools to chip…
http://www.sichinamag.comhttp://article.sichinamag.com/2007-11/20071115104334.htm -- 2007-11-15 0:00:00
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FLANDERS, NJ (November 7, 2007)—Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in high-performance process control metrology, today announced the launch and first shipments of its new S3000A Transparent Thin Film Metrology System. Multiple tools in each of the next two quarters are scheduled …
http://www.sichinamag.comhttp://article.sichinamag.com/2007-11/2007118114918.htm -- 2007-11-8 0:00:00
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Flanders, New Jersey (October 15, 2007)—Rudolph Technologies, Inc.(NASDAQ: RTEC), a leading provider of process characterization solutions for the semiconductor manufacturing industry, today announced that it has seen rapid acceptance of its TrueADC™ Software for automatic defect classification. First rele…
http://www.sichinamag.comhttp://article.sichinamag.com/2007-10/20071016024407.htm -- 2007-10-16 0:00:00
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FLANDERS, NJ (October 1, 2007)— Rudolph Technologies, Inc.(NASDAQ: RTEC), a leading provider of process characterization solutions for the semiconductor manufacturing industry, today announced it has sold an AXi Automated Macro Defect Inspection System to a leading Japanese company in the automotive sector …
http://www.sichinamag.comhttp://article.sichinamag.com/2007-10/2007108021629.htm -- 2007-10-8 0:00:00
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世界领先为半导体制造行业提供微缺陷检测系统的Rudolph Technologies公司日前宣布，两家300mm存储器制造厂商已经安装DMSVision良率管理系统。这两家厂商目前正采用70nm工艺，其中一家将在2008年转向45nm。 DMSVision管理系统能够收集存储并分析整…
http://www.sichinamag.comhttp://article.sichinamag.com/2007-09/2007920105834.htm -- 2007-9-20 0:00:00
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FLANDERS, NJ (September 17, 2007)—Rudolph Technologies, Inc. (NASDAQ: RTEC), a worldwide leader in high-performance process control metrology, defect inspection and data analysis for the semiconductor manufacturing industry, announced today that two 300 mm fabs have installed Rudolph's DMSVisionT…
http://www.sichinamag.comhttp://article.sichinamag.com/2007-09/2007918115344.htm -- 2007-9-18 0:00:00
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Rudolph Technologies, Inc. (NASDAQ: RTEC), the leading provider of process characterization systems for the semiconductor manufacturing industry, will showcase the AXi™ 935 Advanced Macro Defect Inspection System during SEMICON® Taiwan, taking place September 12-14, 2007 at the Taipei World …
http://www.sichinamag.comhttp://article.sichinamag.com/2007-09/2007912113554.htm -- 2007-9-12 0:00:00
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Rudolph Technologies 日前宣布将为光刻设备供应商ASML Holding NV (ASML)提供边缘检测工具，助其提升浸没式光刻工艺中晶圆缺陷检测控制过程,使浸没式光刻生产能力最大化。 缺陷检测工作将在ASML荷兰Belhaven总部进行，并利用Rudolph公司全套表面检测系…
http://www.sichinamag.comhttp://article.sichinamag.com/2007-09/200797102133.htm -- 2007-9-7 0:00:00
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Rudolph Technologies (NASDAQ:RTEC) announced today it has provided an edge inspection tool to lithography system provider ASML Holding NV (ASML) (Euronext Amsterdam, NASDAQ: ASML) to help characterize wafer defects originating from process control issues at the wafer edge and accentuated by the immersi…
http://www.sichinamag.comhttp://article.sichinamag.com/2007-09/200795013059.htm -- 2007-9-5 0:00:00
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