• 《半导体国际》第三届光刻技术研讨会圆满闭幕

        光刻作为推动半导体制造技术的关键工艺一直以来备受业界的关注。近年来,随着器件尺寸的不断缩小,作为现有光学光刻技术的延伸,浸没式光刻因其能获得更高的数值孔径而实现更高的分辨率为业界所追捧,然而在以0.15微米以上技术为主流的中国半导体制造业,在引进海外技术先进技术的同时,我们更加关注如何推动国内光刻技术水平的发展,如何加快国产光刻设备业的研发创新,促进中国半导体制造业的持续快速发展。2007年10月25日,《半导体国际》第三届光刻技术研讨会于上海龙东商务酒店圆满结束,来自中芯国际和特许半导体,以及Applied Materials、Entegris、ASML、苏州华飞微电子材料公司的资深专家针对光刻技术的发展及应用和案例做了精彩的演讲,会议吸引了SMIC、HHNEC、TSMC、GSMC、Belling、ASMC等晶圆厂的众多工程师,互动气氛尤为热烈。会后,针对光刻经理人《半导体国际》举办了Pannel Discussion论坛,各位嘉宾竞相发言,探讨了光刻技术以及中国半导体产业现状和发展观,让我们在严峻的形势下看到未来的希望。

  • Practical Solution for 193nm Reticle Haze
  • 193nm掩膜版雾状缺陷解决方案
  • Zhang Xue Song,Field Application Supervisor,Entegris China.
  • Reticle Haze or Ammonia Sulfate growth has been a problem to the industry since the introduction of 193nm process tools and Phase Shift Masks.Reticle Haze has increased an already costly process step to the point that a change must be implementde in order to control the problem.The Entegris Clarilite system was developed as an approach to provide a solution to the reticle haze problem.
  • Integrated Post-Tapeout Flow and Development of OPC Technology
  • Chi-Yuan Hung ,Member of Technical Staff of CTO office, Chartered Semiconductor Manufacturing
  • As IC design rules shrink dramatically in order to keep pace with Moore’s Law, semiconductor devices are being fabricated with features that are less than half the wavelength of the available lithography exposure tools. Increasing circuit density has improved the complexity and performance of ICs but also led to serious patterning proximity effects. These effects which make the chips almost impossible to fabricate without optical proximity correction (OPC) technology.
  • Lithography Trend
  • 光刻技术的发展趋势
  • Oliver Li,Senior Technical Manager,Logic Technology Development Center Litho Department,SMIC
  • ·Today’s mainstream lithography;
  • ·Today’s Lithography and its Issues & Challenges;
  • ·45nm& beyond Lithography Approach;
  • ·China Lithography status.
  • 伍强:ASML公司设备应用部经理。曾经担任上海华虹NEC电子有限公……
  • 李庆刚:目前在中芯国际技术研发中心任职,负责130nm/90nm/65nm……
  • 崔彰日:目前是中心国际上海adv. module C的一位资深技术经理,负……
  • 程天风:前ASML中国的技术行销经理,负责发展中国和台湾地区的业……
  • 张赞彬:目前为KLA-Tencor 中国分公司的资深技术总监,负责中国……
  • 梁远亮:1982年获得英格兰索尔福德大学化学工程学士学位;1987年……
  • 徐建:目前是东电电子的主任工程师,负责TEL匀胶显影部在中芯国……
演讲嘉宾
演讲题目
资料下载
Erez Ravid,Director of Marketing Inspection Division, PDC Applied Materials
光刻缺陷的控制 The Fight for Light
Zhang Xue Song,Field Application Supervisor,Entegris China.
193nm掩膜版雾状缺陷解决方案
Chi-Yuan Hung ,Member of Technical Staff of CTO office, Chartered Semiconductor Manufacturing
国内先进光刻胶的发展与应用
Ran Ruicheng, GM/General Engineer, Suzhou HuaFei Micro-electronic Materials, Inc.
The Development and Application of Domestic Advanced Photoresist
Oliver Li,Senior Technical Manager,Logic Technology Development Center Litho Department,SMIC
光刻技术的发展趋势
Wu Qiang, ASML
A summary of photolithography in march 2007
主办单位
 
http://www.sichinamag.com
 
支持单位
 
http://www.sica.org.cn
 
白金赞助
 
http://www.entegris.com/Haze.aspx
 
黄金赞助
 
http://www.appliedmaterials.com/
 
白银赞助
 
http://www.spectragases.com.cn/
 
特别支持
 
http://www.asml.com
 
特别演讲
 
http://www.smics.com/
 
http://www.charteredsemi.com/
 
往届研讨会回顾
 
第二届光刻技术研讨会